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Characterization Of Wide Bandgap Power Semiconductor Devices at Meripustak

Characterization Of Wide Bandgap Power Semiconductor Devices by Fei Wang ,  Zheyu Zhang ,  Edward A. Jones, Institution Of Engineering And Technology

Books from same Author: Fei Wang ,  Zheyu Zhang ,  Edward A. Jones

Books from same Publisher: Institution Of Engineering And Technology

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  • General Information  
    Author(s)Fei Wang ,  Zheyu Zhang ,  Edward A. Jones
    PublisherInstitution Of Engineering And Technology
    ISBN9781785614910
    Pages347
    BindingHardback
    LanguageEnglish
    Publish YearOctober 2018

    Description

    Institution Of Engineering And Technology Characterization Of Wide Bandgap Power Semiconductor Devices by Fei Wang ,  Zheyu Zhang ,  Edward A. Jones

    At The Heart Of Modern Power Electronics Converters Are Power Semiconductor Switching Devices. The Emergence Of Wide Bandgap (Wbg) Semiconductor Devices Including Silicon Carbide And Gallium Nitride Promises Power Electronics Converters With Higher Efficiency Smaller Size Lighter Weight And Lower Cost Than Converters Using The Established Silicon-Based Devices. However Wbg Devices Pose New Challenges For Converter Design And Require More Careful Characterization In Particular Due To Their Fast Switching Speed And More Stringent Need For Protection.Characterization Of Wide Bandgap Power Semiconductor Devices Presents Comprehensive Methods With Examples For The Characterization Of This Important Class Of Power Devices. After An Introduction The Book Covers Pulsed Static Characterization; Junction Capacitance Characterization; Fundamentals Of Dynamic Characterization; Gate Drive For Dynamic Characterization; Layout Design And Parasitic Management; Protection Design For Double Pulse Test; Measurement And Data Processing For Dynamic Characterization; Cross-Talk Consideration; Impact Of Three-Phase System; And Topology Considerations.



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