Shopping Cart
0 Item in Cart
Digital Holography for MEMS and Microsystem Metrology

Digital Holography for MEMS and Microsystem Metrology
Books from same Author: Anand Asundi
Books from same Publisher: John Wiley

Rating  
(80 Ratings)

Retail Price: 0.00/-
Price: 0.00/-
Inclusive all taxes
10.00% OFF
Sold By: Store4Doctors

Offer 1: Get 10.00% + Flat ₹ 50 discount on shopping of ₹ 1000
                use code:
IND50

Offer 2: Get 10.00% + Flat ₹ 100 discount on shopping of
                ₹ 1500 use code:
IND100

Offer 3: Get 10.00% + Flat ₹ 300 discount on shopping of
                ₹ 5000 use code:
MPSTK300

Free Shipping (for orders above ₹ 499)  *T&C apply.

Out of Stock Click For New Edition


Need Help!! Click Here
Description

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in–line holography, and digital holographic tomography and applications. Covers other applications including micro–optical and diffractive optical systems and the testing of these components, and bio–imaging.

More Details About Digital Holography for MEMS and Microsystem Metrology
100 % AUTHENTIC PRODUCT GUARANTEE
Each book uploaded on our portal passes through rigorous Anti-Piracy check to ensure the book is genuine. We have teams deployed for checking the quality at multiple levels.
Team 1 : Before uploading a book we ensure each book is coming through an approved source.
Team 2 : Before an order goes for packing we checks the authenticity of the procuring source. Then only we process the order.
General Information
Author(s)Anand Asundi
PublisherJohn Wiley
ISBN9780470978696
Pages232
BindingHardcover
LanguageEnglish
Publish YearJanuary 2011
Reviews of Digital Holography for MEMS and Microsystem Metrology
Average Rating

Write A Review

TOP REVIEWS


Top Reviews lists the most relevant product reviews only.


RECENT TOP REVIEWS