In Situ Materials Characterization Across Spatial and Temporal Scales Vol 193 at Meripustak

In Situ Materials Characterization Across Spatial and Temporal Scales Vol 193

Books from same Author: ZIEGLER

Books from same Publisher: SPRINGER

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  • General Information  
    Author(s)ZIEGLER
    PublisherSPRINGER
    ISBN9783642451515
    Pages256
    BindingHardbound
    LanguageEnglish
    Publish YearApril 2014

    Description

    SPRINGER In Situ Materials Characterization Across Spatial and Temporal Scales Vol 193 by ZIEGLER

    The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.