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Introduction To Optical Metrology

Introduction To Optical Metrology
Books from same Author: Rajpal S Sirohi
Books from same Publisher: T and F CRC

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Key Features
  • Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
  • Describes the different principles used to measure the refractive indices of solids, liquids, and ga
  • Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and le
  • Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurement
  • Depicts a wave propagating in the positive z-direction by ei(?t – kz), as opposed to ei(kz – ?t)
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Description

Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals. Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

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General Information
Author(s)Rajpal S Sirohi
PublisherT and F CRC
ISBN9781482236101
Pages449
BindingHardcover
LanguageEnglish
Publish YearJuly 2015
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