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Power Thermal Noise And Signal Integrity Issues On Substrate Interconnects Entanglement (Hb 2019)  at Meripustak

Power Thermal Noise And Signal Integrity Issues On Substrate Interconnects Entanglement (Hb 2019) by Yue Ma and Christian Gontrand, Taylor & Francis

Books from same Author: Yue Ma and Christian Gontrand

Books from same Publisher: Taylor & Francis

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  • General Information  
    Author(s)Yue Ma and Christian Gontrand
    PublisherTaylor & Francis
    ISBN9780367023430
    Pages226
    BindingHardback
    LanguageEnglish
    Publish YearMarch 2019

    Description

    Taylor & Francis Power Thermal Noise And Signal Integrity Issues On Substrate Interconnects Entanglement (Hb 2019) by Yue Ma and Christian Gontrand

    As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.show more



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