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Proceedings 5th International Conference on Optics of Surfaces and Interfaces OSI-V Leon Mexico 2004 Edition at Meripustak

Proceedings 5th International Conference on Optics of Surfaces and Interfaces OSI-V Leon Mexico 2004 Edition by Guest editor Bernardo S. Mendoza , Wiley

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  • General Information  
    Author(s)Guest editor Bernardo S. Mendoza
    PublisherWiley
    ISBN9783527404940
    Pages250
    BindingHardback
    LanguageEnglish
    Publish YearApril 2004

    Description

    Wiley Proceedings 5th International Conference on Optics of Surfaces and Interfaces OSI-V Leon Mexico 2004 Edition by Guest editor Bernardo S. Mendoza

    "Physica Status Solidi [Copyright] Conferences And Critical Reviews" Publishes Conference Proceedings, Ranging From Large International Meetings To Specialized Topical Workshops As Well As Collections Of Topical Reviews On Various Areas Of Current Solid State Physics Research. The Objective Of "Optics Of Surfaces And Interfaces" (Osi-V) Is To Bridge The Gap Between Basic And Applied Science. Apart From Recent Advances In Theoretical Modeling And Experimental Research, Special Attention Is Given To Novel Techniques Of Optical Spectroscopy At Interfaces. Table Of Contents : - Preface. Committees. Surface Excitonic Effects. Surface--Induced Broadening And Shift Of Exciton Ground--State Resonance In Quantum Wells (N. Atenco--Analco, N.M. Makarov And F. Perez--Rodriguez). Fine Structure Of Reflectance Spectra Due To Exciton Quantization In Near--Surface Quantum Wells Based On Zns X Se 1 -- X Ternary Alloys (P.I. Kuznetsov, J. Madrigal--Melchor, F. Perez--Rodriguez, S.O. Romanovsky, A.V. Sel'Kin And G.G. Yakushcheva). General Theory And Experimental Techniques. Many--Body And Overlayer Effects On Surface Optical Properties (F. Bechstedt, R. Del Sole, S. Glutsch, P.H. Hahn, O. Pulci And W.G. Schmidt). High--Resolution Measurement Of The Bulk Dielectric Constants Of Single Crystal Gold With Application To Reflection Anisotropy Spectroscopy (N.P. Blanchard, C. Smith, D.S. Martin, D.J. Hayton, T.E. Jenkins And P. Weightman). In--Situ Ellipsometry: Identification Of Surface Terminations During Gan Growth (C. Cobet, T. Schmidtling, M. Drago, N. Wollschlager, N. Esser, W. Richter And R.M. Feenstra). Optical Reflectance Of A Composite Medium With A Sparse Concentration Of Large Spherical Inclusions (A. Garcia--Valenzuela And R.G. Barrera). Spin/Carrier Dynamics At Semiconductor Interfaces Using Intense, Tunable, Ultra--Fast Lasers (Y. Jiang, R. Pasternak, Z. Marka, Y.V. Shirokaya, J.K. Miller, S.N. Rashkeev, Yu D. Glinka, I.E. Perakis, P.K. Roy, J. Kozub, B.K. Choi, D.M. Fleetwood, R.D. Schrimpf, X. Liu, Y. Sasaki, J.K. Furdyna And N.H. Tolk). Drastic Improvement Of Electrical Properties Of Nafion(R) 112 Membrane On Impregnation Of Bimetallic Au/Pd Nanoclusters (U. Pal, J.F. Sanchez--Ramirez, S.A. Gamboa, P.J. Sebastian And R. Perez). In--Situ Raman Spectroscopy On Iii--V Semiconductors At High Temperature In Movpe (E. Speiser, T. Schmidtling, K. Fleischer, N. Esser And W. Richter). Infrared Spectroscopy. Formation Of Cu X Clusters In Cu/Zno Nanocomposites Studied By Ir Spectroscopy (U. Pal, O. Vazquez--Cuchillo, A. Bautista--Hernandez And F. Rivas--Silva). Infrared Spectroscopy Of High K Thin Layer By Multiple Internal Reflection And Attenuated Total Reflection (N. Rochat, K. Dabertrand, V. Cosnier, S. Zoll, P. Besson And U. Weber). Reflectance Anisotropy Spectroscopy (Ras). Isotropic And Anisotropic Optical Reflectances Of Clean And Hydrogen--Covered Si(001)2X1 Surfaces (Y. Borensztein, N. Witkowski And S. Royer). Reflectance Anisotropy For Porphyrin Octaester Langmuir--Schaefer Films (C. Castillo, R.A. Vazquez--Nava And Bernardo S. Mendoza). Effect Of Adsorption Of Electronegative And Electropositive Elements On The Surface Optical Anisotropy Of Gaas(001) (C. Hogan, D. Paget, O.E. Tereschchenko And R. Del Sole). Giant Reflectance Anisotropy Of Polar Cubic Semiconductors In The Far Infrared (Yu. A. Kosevich, J. Ortega--Gallegos, A.G. Rodriguez, L.F. Lastras--Martinez And A. Lastras--Martinez). Model For The Strain--Induced Reflectance--Difference Spectra Of Ingaas/G



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