×







We sell 100% Genuine & New Books only!

Reliability Of Mems Testing Of Materials And Devices at Meripustak

Reliability Of Mems Testing Of Materials And Devices by Osamu Tabata, John Wiley

Books from same Author: Osamu Tabata

Books from same Publisher: John Wiley

Related Category: Author List / Publisher List


  • Price: ₹ 8781.00/- [ 12.99% off ]

    Seller Price: ₹ 7640.00

Estimated Delivery Time : 4-5 Business Days

Sold By: Meripustak      Click for Bulk Order

Free Shipping (for orders above ₹ 499) *T&C apply.

In Stock

We deliver across all postal codes in India

Orders Outside India


Add To Cart


Outside India Order Estimated Delivery Time
7-10 Business Days


  • We Deliver Across 100+ Countries

  • MeriPustak’s Books are 100% New & Original
  • General Information  
    Author(s)Osamu Tabata
    PublisherJohn Wiley
    ISBN9783527335015
    Pages324
    BindingPaperback
    LanguageEnglish
    Publish YearJanuary 2013

    Description

    John Wiley Reliability Of Mems Testing Of Materials And Devices by Osamu Tabata

    This edition of 'Reliability of MEMS' was originally published in the successful series 'Advanced Micro & Nanosystems'. Here, one of the most important hurdles to commercialization for microelectromechanical systems is covered in detail: the reliability of MEMS materials and devices. Due to their microscale size combined with novel functionalities, a whole new category of challenges arises, and proper determination of a given device's reliability is instrumental in determining its range of usability and application fields. Any kind of gadget's performance, lifetime and safety will depend on the continued and predictable functioning of both the electronic as well as the micromechanical parts. MEMS reliability therefore can be as serious as human life–and–death matters – quite literally in the case of roll–over sensors for cars, for example.



    Book Successfully Added To Your Cart