Description

Advances in Imaging and Electron Physics merges two long-running serials - Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. It features contributions from leading authorities. It provides informs and updates on all the latest developments in the field.

More Details about Silicon-based Millimetre-wave Technology

General Information  
Author(s)Jamal Deen
PublisherElsevier Science
ISBN9780123942982
Pages484
BindingHardcover
LanguageEnglish
Publish YearJanuary 2012