Theoretical Concepts Of X-Ray Nanoscale Analysis Vol 183 at Meripustak

Theoretical Concepts Of X-Ray Nanoscale Analysis Vol 183

Books from same Author: Andrey Benediktovich and Ilya D Feranchuk and Alexander P Ulyanenkov

Books from same Publisher: SPRINGER

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  • General Information  
    Author(s)Andrey Benediktovich and Ilya D Feranchuk and Alexander P Ulyanenkov
    PublisherSPRINGER
    ISBN9783642381768
    Pages318
    BindingHardbound
    LanguageEnglish
    Publish YearSeptember 2013

    Description

    SPRINGER Theoretical Concepts Of X-Ray Nanoscale Analysis Vol 183 by Andrey Benediktovich and Ilya D Feranchuk and Alexander P Ulyanenkov

    This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.