×







We sell 100% Genuine & New Books only!

Defect Sizing Using Non-destructive Ultrasonic Testing Applying Bandwidth-Dependent DAC and DGS Curves at Meripustak

Defect Sizing Using Non-destructive Ultrasonic Testing Applying Bandwidth-Dependent DAC and DGS Curves by Wolf Kleinert , Springer

Books from same Author: Wolf Kleinert

Books from same Publisher: Springer

Related Category: Author List / Publisher List


  • Price: ₹ 30133.00/- [ 7.00% off ]

    Seller Price: ₹ 28023.00

Estimated Delivery Time : 4-5 Business Days

Sold By: Meripustak      Click for Bulk Order

Free Shipping (for orders above ₹ 499) *T&C apply.

In Stock

We deliver across all postal codes in India

Orders Outside India


Add To Cart


Outside India Order Estimated Delivery Time
7-10 Business Days


  • We Deliver Across 100+ Countries

  • MeriPustak’s Books are 100% New & Original
  • General Information  
    Author(s)Wolf Kleinert
    PublisherSpringer
    ISBN9783319328348
    Pages118
    BindingHardback
    LanguageEnglish
    Publish YearMay 2016

    Description

    Springer Defect Sizing Using Non-destructive Ultrasonic Testing Applying Bandwidth-Dependent DAC and DGS Curves by Wolf Kleinert

    This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves._x000D_ Table of contents : - _x000D_ Preface.- Sizing Methods: Distance Gain Size (DGS) and Distance Amplitude Correction (DAC).- A new approach to bring DGS and DAC close together.- Diagrams.- Perspectives._x000D_



    Book Successfully Added To Your Cart