Description
Springer Polymer Microscopy 2008 Edition by Linda Sawyer David T. Grubb Gregory F. Meyers
This extensively updated and revised Third Edition is a comprehensive and practical guide to the study of the microstructure of polymers. It is the result of the authors' many years of academic and industrial experience. Introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied with many examples of specimen preparation and image interpretation leading to materials characterization. Emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy are considered. The book closes with a problem solving guide. Table of contents : Introduction to polymer morphology. -Polymer materials. -Introduction. -Definitions. -Polymer morphology. -Amorphous polymers. -Semicrystalline polymers. -Liquid crystalline polymers. -Polymer processes. -Others that could be incorporated into 3rd ed.include: blown film processing; coating process multi-layer extrusion. -Extrusion of fibers and films. -Extrusion and molding. -Polymer characterization. -General techniques. -Microscopy techniques. -Specimen preparation methods. -Applications of microscopy to polymers. -New microscopy techniques. -Fundamentals of microscopy. -Introduction. -Lens - imaging microscopes. -Scanning - imaging microscopes. -Optical microscopy (OM). -Introduction Objective lenses Imaging modes Measurement of refractive index Polarized light Scanning electron microscopy (SEM) Introduction Imaging signals SEM optimization Special SEM types -FESEM is now standardTransmission electron microscopy (TEM) Imaging in the TEM Diffraction techniques Phase contrast and lattice imaging Scanning probe microscopy (SPM) Introduction Family of techniques figure with emphasis on force microscopyImaging Modes a) Contact mode incl. force modulation and friction;b) Tapping and Phase;c) Non- contact incl. EFM and MFMSPM Probes Microscopy of radiation sensitive materials condense this section and/or move to new artifacts or issues topic SEM operation Low dose TEM operation Analytical microscopy X-ray microanalysis X-ray analysis in the SEM vs AEM Elemental mapping EELS Electron energy loss in conjuntion with morphology (TEM)Quantitative microscopy Calibration -describe needs for SPM - 3 dimensional calibration of distance; force calibrationImage processing Stereology and image analysis -description of advantages of phase image contrast by SPM as input for IA Dynamic microscopy Stages for dynamic microscopy Include SPM tensile and hot stages Imaging theory Imaging with lenses Basic optics Resolution Electron diffraction Contrast mechanisms Illumination systems Imaging by scanning electron beam Scanning optics Beam - specimen interactions Image formation Imaging by scanning a solid probe -complete re-write simplifying equations for important conceptsContact modes Force interactions Image and contrast formation Intermittent contact mode and phase imaging Force interactions all the stuff about cantilever dynamics linear vs. non-linear and practical aspects of contrast formation Non-contact modes Long range forces and image formation in EFM and MFMArtifacts due to probe-surface interaction Polarizing microscopy Polarized light Anisotropic materials Polarizing microscopy Radiation effects - will consider moving to a topic on artifacts Effect of radiation on polymers Radiation doses and specimen heating Effects of radiation damage on the image Noise limited resolution Image processing Specimen preparation methods Simple preparation methods Optical methods SEM methods TEM methods SPM methods Polishing Microtomy Peelback of fibers/films for SEM Microtomy for OM MIcrotomy for SEM Microtomy for SPM Microtomy for TEM Ultrathin sectioning Ultrathin cryosectioning Staining Introduction Osmium tetroxide Ebonite Chlorosulfonic acid Phosphotungstic acid Ruthenium tetroxide Silver sulfide Mercuric trifluoroacetate Iodine Summary Etching Introduction Plasma and ion etching Solvent and chemical etching Acid etching Summary Replication Simple replicas Replication for TEM Conductive coatings Coating devices Coatings for TEM Coatings for SEM and SPM Artifacts Gold decoration Yielding and fracture Fractography Fracture: standard physical testing In situ deformation in-situ AFM tensile stagesCrazing thinning in crazed zones Freezing and drying methods Simple freezing methods Freeze drying Critical point drying Freeze fracture-etching Polymer applications Include in each of those specific SPM examples Fibers Introduction Textile fibers Problem solving applications Industrial fibers Films and membranes Introduction Model studies Industrial films Thin Films for Electronics Abrasion Resistant Coatings Flat film membranes Hollow fiber membranes Engineering resins and plastics Introduction Semicrystalline polymers Amorphous polymers Extrudates and molded parts Multiphase polymers Failure analysis Image analysis of impact modified resins Composites Introduction Composite characterization Fiber composites Particle filled composites Carbon black filled rubber Nanocomposites Emulsions and adhesives Introduction Latexes Wettability Adhesives and adhesion Liquid crystalline polymers Decrease level of detail in this sectionIntroduction Optical textures Solid state structures High modulus fibers Structure-property relations in LCPs New techniques in polymer microscopy This will be an entirely new chapterIntroduction Optical microscopy Confocal scanning microscopy Near field optical microscopy Scanning electron microscopy (SEM) Low voltage SEM High resolution SEM High pressure (environmental) SEM EDS detection Solid State detectors Calorimetric detectors Transmission electron microscopy (TEM) High resolution TEM Structure determination by electron diffraction environmental TEM 3D tomography Scanning tunneling microscopy (STM) Only keep a small sectionPrinciples of STM Instrumentation and operation of the STM STM of insulators Adsorbed organic molecules Other polymer applications Scanning force microscopy (SFM) 6.6.1 New probes and atomic resolution6.6.2 Fast scanning SPMs6.6.3 Nanoscale mechanical mapping6.6.4 Environmental SPM6.6.5 Chemical Force Microscopy (CFM)6.6.6 Nanomanipulation with AFMNew emerging techniques Near field scanning optical microscopy X-ray microscopy (STXM Tomography X-ray methodologiesMicro-CT or Nano-CT (benchtop x- ray)-resolution and speed for identifying flawsImaging surface science Short section if included at all-SIMS XPS PEEM SPEMProblem solving summary Where to start Problem solving protocol Polymer structures Instrumental techniques Comparison of techniques Optical techniques SEM techniques TEM techniques STEM techniques SFM techniques Technique selection Interpretation Artifacts Summary Supporting characterizations X-ray diffraction Thermal analysis Spectroscopy Scattering Summary Appendixes Appendix I Abbreviations of polymer names Appendix II List of acronyms - techniques Appendix III Manmade polymer fibers Appendix IV Common commercial polymers and tradenames for plastics films and engineering resins See what reviewers think about need for update belowAppendix V General suppliers of microscopy accessories Appendix VI Suppliers of optical and electron microscopes Appendix VII Suppliers of x-ray microanalysis equipment Appendix VIII Suppliers of scanning probe microscopes Indexshow more