Description

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

More Details about X-Ray Diffraction: Modern Experimental Techniques

General Information  
Author(s)Seeck
PublisherT&F Pan
ISBN9789814303590
Pages414
BindingHardcover
LanguageEnglish
Publish YearJanuary 2015